The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model

The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. I. Theoretical model

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Bibliographische Detailangaben
Datum:	2015
Hauptverfasser:	V. V. Lizunov, E. V. Kochelab, E. S. Skakunova, E. G. Len, V. B. Molodkin, S. I. Olikhovskij, N. G. Tolmachjov, B. V. Sheludchenko, S. V. Lizunova, L. N. Skapa
Format:	Artikel
Sprache:	English
Veröffentlicht:	2015
Schriftenreihe:	Nanosystems, nanomaterials, nanotechnologies
Online Zugang:	http://jnas.nbuv.gov.ua/article/UJRN-0000454326
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Назва журналу:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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