Lizunov, V. V., Kochelab, E. V., Skakunova, E. S., Len, E. G., Molodkin, V. B., Olikhovskij, S. I., . . . Skapa, L. N. (2015). The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. II. Numerical experiment.
Chicago Style (17th ed.) CitationLizunov, V. V., et al. The Dispersion Sensitivity of Scattering Pattern to Defects Depending on Thickness of Crystalline Products of Nanotechnologies. II. Numerical Experiment. 2015.
MLA (8th ed.) CitationLizunov, V. V., et al. The Dispersion Sensitivity of Scattering Pattern to Defects Depending on Thickness of Crystalline Products of Nanotechnologies. II. Numerical Experiment. 2015.
Warning: These citations may not always be 100% accurate.