Стиль цитування APA (7-ме видання)

Lizunov, V. V., Kochelab, E. V., Skakunova, E. S., Len, E. G., Molodkin, V. B., Olikhovskij, S. I., . . . Skapa, L. N. (2015). The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. II. Numerical experiment.

Чикаго стиль цитування (17-те видання)

Lizunov, V. V., et al. The Dispersion Sensitivity of Scattering Pattern to Defects Depending on Thickness of Crystalline Products of Nanotechnologies. II. Numerical Experiment. 2015.

Стиль цитування MLA (8-ме видання)

Lizunov, V. V., et al. The Dispersion Sensitivity of Scattering Pattern to Defects Depending on Thickness of Crystalline Products of Nanotechnologies. II. Numerical Experiment. 2015.