The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. II. Numerical experiment

The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. II. Numerical experiment

Збережено в:
Бібліографічні деталі
Дата:2015
Автори: V. V. Lizunov, E. V. Kochelab, E. S. Skakunova, E. G. Len, V. B. Molodkin, S. I. Olikhovskij, N. G. Tolmachjov, B. V. Sheludchenko, S. V. Lizunova, L. N. Skapa
Формат: Стаття
Мова:English
Опубліковано: 2015
Назва видання:Nanosystems, nanomaterials, nanotechnologies
Онлайн доступ:http://jnas.nbuv.gov.ua/article/UJRN-0000454339
Теги: Додати тег
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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spelling open-sciencenbuvgovua-601292024-04-16T12:48:09Z The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. II. Numerical experiment V. V. Lizunov E. V. Kochelab E. S. Skakunova E. G. Len V. B. Molodkin S. I. Olikhovskij N. G. Tolmachjov B. V. Sheludchenko S. V. Lizunova L. N. Skapa 1816-5230 2015 en Nanosystems, nanomaterials, nanotechnologies http://jnas.nbuv.gov.ua/article/UJRN-0000454339 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Nanosystems, nanomaterials, nanotechnologies
spellingShingle Nanosystems, nanomaterials, nanotechnologies
V. V. Lizunov
E. V. Kochelab
E. S. Skakunova
E. G. Len
V. B. Molodkin
S. I. Olikhovskij
N. G. Tolmachjov
B. V. Sheludchenko
S. V. Lizunova
L. N. Skapa
The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. II. Numerical experiment
format Article
author V. V. Lizunov
E. V. Kochelab
E. S. Skakunova
E. G. Len
V. B. Molodkin
S. I. Olikhovskij
N. G. Tolmachjov
B. V. Sheludchenko
S. V. Lizunova
L. N. Skapa
author_facet V. V. Lizunov
E. V. Kochelab
E. S. Skakunova
E. G. Len
V. B. Molodkin
S. I. Olikhovskij
N. G. Tolmachjov
B. V. Sheludchenko
S. V. Lizunova
L. N. Skapa
author_sort V. V. Lizunov
title The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. II. Numerical experiment
title_short The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. II. Numerical experiment
title_full The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. II. Numerical experiment
title_fullStr The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. II. Numerical experiment
title_full_unstemmed The dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. II. Numerical experiment
title_sort dispersion sensitivity of scattering pattern to defects depending on thickness of crystalline products of nanotechnologies. ii. numerical experiment
publishDate 2015
url http://jnas.nbuv.gov.ua/article/UJRN-0000454339
work_keys_str_mv AT vvlizunov thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT evkochelab thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT esskakunova thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT eglen thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT vbmolodkin thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT siolikhovskij thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT ngtolmachjov thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT bvsheludchenko thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT svlizunova thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT lnskapa thedispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT vvlizunov dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT evkochelab dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT esskakunova dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT eglen dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT vbmolodkin dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT siolikhovskij dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT ngtolmachjov dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT bvsheludchenko dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT svlizunova dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
AT lnskapa dispersionsensitivityofscatteringpatterntodefectsdependingonthicknessofcrystallineproductsofnanotechnologiesiinumericalexperiment
first_indexed 2024-04-17T04:23:23Z
last_indexed 2024-04-17T04:23:23Z
_version_ 1796883548931620864

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