Modified backscattering method of the nanometer self-supporting films and surface layers thickness measurements

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Bibliographic Details
Date:2015
Main Author: V. I. Soroka
Format: Article
Language:English
Published: 2015
Series:Nuclear physics and atomic energy
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0000516847
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Journal Title:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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spelling open-sciencenbuvgovua-628122024-04-16T13:03:50Z Modified backscattering method of the nanometer self-supporting films and surface layers thickness measurements V. I. Soroka 1818-331X 2015 en Nuclear physics and atomic energy http://jnas.nbuv.gov.ua/article/UJRN-0000516847 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Nuclear physics and atomic energy
spellingShingle Nuclear physics and atomic energy
V. I. Soroka
Modified backscattering method of the nanometer self-supporting films and surface layers thickness measurements
format Article
author V. I. Soroka
author_facet V. I. Soroka
author_sort V. I. Soroka
title Modified backscattering method of the nanometer self-supporting films and surface layers thickness measurements
title_short Modified backscattering method of the nanometer self-supporting films and surface layers thickness measurements
title_full Modified backscattering method of the nanometer self-supporting films and surface layers thickness measurements
title_fullStr Modified backscattering method of the nanometer self-supporting films and surface layers thickness measurements
title_full_unstemmed Modified backscattering method of the nanometer self-supporting films and surface layers thickness measurements
title_sort modified backscattering method of the nanometer self-supporting films and surface layers thickness measurements
publishDate 2015
url http://jnas.nbuv.gov.ua/article/UJRN-0000516847
work_keys_str_mv AT visoroka modifiedbackscatteringmethodofthenanometerselfsupportingfilmsandsurfacelayersthicknessmeasurements
first_indexed 2025-07-18T02:53:41Z
last_indexed 2025-07-18T02:53:41Z
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