Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors
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| Datum: | 2015 |
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| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | Englisch |
| Veröffentlicht: |
2015
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| Schriftenreihe: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| Online Zugang: | http://jnas.nbuv.gov.ua/article/UJRN-0000706499 |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
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Library portal of National Academy of Sciences of Ukraine | LibNAS| _version_ | 1859525950634459136 |
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| author | V. S. Slipokurov M. N. Dub A. K. Tkachenko Ya. Ya. Kudryk |
| author_facet | V. S. Slipokurov M. N. Dub A. K. Tkachenko Ya. Ya. Kudryk |
| author_sort | V. S. Slipokurov |
| collection | Open-Science |
| first_indexed | 2025-07-22T05:01:11Z |
| format | Article |
| id | open-sciencenbuvgovua-65499 |
| institution | Library portal of National Academy of Sciences of Ukraine | LibNAS |
| language | English |
| last_indexed | 2025-07-22T05:01:11Z |
| publishDate | 2015 |
| record_format | dspace |
| series | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| spelling | open-sciencenbuvgovua-654992024-04-16T13:18:28Z Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors V. S. Slipokurov M. N. Dub A. K. Tkachenko Ya. Ya. Kudryk 1560-8034 2015 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000706499 Article |
| spellingShingle | Semiconductor Physics, Quantum Electronics and Optoelectronics V. S. Slipokurov M. N. Dub A. K. Tkachenko Ya. Ya. Kudryk Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors |
| title | Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors |
| title_full | Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors |
| title_fullStr | Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors |
| title_full_unstemmed | Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors |
| title_short | Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors |
| title_sort | methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors |
| url | http://jnas.nbuv.gov.ua/article/UJRN-0000706499 |
| work_keys_str_mv | AT vsslipokurov methodologicalaspectsofmeasuringtheresistivityofcontactstohighresistancesemiconductors AT mndub methodologicalaspectsofmeasuringtheresistivityofcontactstohighresistancesemiconductors AT aktkachenko methodologicalaspectsofmeasuringtheresistivityofcontactstohighresistancesemiconductors AT yayakudryk methodologicalaspectsofmeasuringtheresistivityofcontactstohighresistancesemiconductors |