Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors
Saved in:
| Date: | 2015 |
|---|---|
| Main Authors: | V. S. Slipokurov, M. N. Dub, A. K. Tkachenko, Ya. Ya. Kudryk |
| Format: | Article |
| Language: | English |
| Published: |
2015
|
| Series: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000706499 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Institution
Library portal of National Academy of Sciences of Ukraine | LibNASSimilar Items
-
Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors
by: Slipokurov, V.S., et al.
Published: (2015) -
Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors
by: Slipokurov, V.S., et al.
Published: (2015) -
Formation of ohmic contacts to n(p)-gan and measurement of their contact resistivity
by: M. S. Boltovets, et al.
Published: (2010) -
Formation of ohmic contacts to n(p)-gan and measurement of their contact resistivity
by: Boltovets, M.S., et al.
Published: (2010) -
Some aspects of thermal resistance measurement technique for IMPATT and light-emitting diodes
by: A. E. Belyaev, et al.
Published: (2011)