Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors

Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors

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Bibliographische Detailangaben
Datum:	2015
Hauptverfasser:	V. S. Slipokurov, M. N. Dub, A. K. Tkachenko, Ya. Ya. Kudryk
Format:	Artikel
Sprache:	English
Veröffentlicht:	2015
Schriftenreihe:	Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Zugang:	http://jnas.nbuv.gov.ua/article/UJRN-0000706499
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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