Degradation of electrooptical characteristics of serial GaP light-emitting diodes, caused by fast electrons - O. V. Konoreva; M. V. Lytovchenko; Ye. V. Malyi; I. V. Petrenko; M. B. Pinkovska; V. P. Tartachnyk; V. V. Shlapatska (Semiconductor Physics, Quantum Electronics and Optoelectronics, 2015)