Dopant depth profile modification during mass Spectrometric analysis of multilayer nanostructures

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Datum:2015
Hauptverfasser: O. O. Yefremov, V. H. Lytovchenko, V. P. Melnyk, O. S. Oberemok, V. H. Popov, B. M. Romaniuk
Format: Artikel
Sprache:Englisch
Veröffentlicht: 2015
Schriftenreihe:Ukrainian Journal of Physics
Online Zugang:http://jnas.nbuv.gov.ua/article/UJRN-0000732056
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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author O. O. Yefremov
V. H. Lytovchenko
V. P. Melnyk
O. S. Oberemok
V. H. Popov
B. M. Romaniuk
author_facet O. O. Yefremov
V. H. Lytovchenko
V. P. Melnyk
O. S. Oberemok
V. H. Popov
B. M. Romaniuk
author_sort O. O. Yefremov
collection Open-Science
first_indexed 2025-07-22T05:09:32Z
format Article
id open-sciencenbuvgovua-65841
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
language English
last_indexed 2025-07-22T05:09:32Z
publishDate 2015
record_format dspace
series Ukrainian Journal of Physics
spelling open-sciencenbuvgovua-658412024-04-16T13:20:44Z Dopant depth profile modification during mass Spectrometric analysis of multilayer nanostructures O. O. Yefremov V. H. Lytovchenko V. P. Melnyk O. S. Oberemok V. H. Popov B. M. Romaniuk 0372-400X 2015 en Ukrainian Journal of Physics http://jnas.nbuv.gov.ua/article/UJRN-0000732056 Article
spellingShingle Ukrainian Journal of Physics
O. O. Yefremov
V. H. Lytovchenko
V. P. Melnyk
O. S. Oberemok
V. H. Popov
B. M. Romaniuk
Dopant depth profile modification during mass Spectrometric analysis of multilayer nanostructures
title Dopant depth profile modification during mass Spectrometric analysis of multilayer nanostructures
title_full Dopant depth profile modification during mass Spectrometric analysis of multilayer nanostructures
title_fullStr Dopant depth profile modification during mass Spectrometric analysis of multilayer nanostructures
title_full_unstemmed Dopant depth profile modification during mass Spectrometric analysis of multilayer nanostructures
title_short Dopant depth profile modification during mass Spectrometric analysis of multilayer nanostructures
title_sort dopant depth profile modification during mass spectrometric analysis of multilayer nanostructures
url http://jnas.nbuv.gov.ua/article/UJRN-0000732056
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AT vhlytovchenko dopantdepthprofilemodificationduringmassspectrometricanalysisofmultilayernanostructures
AT vpmelnyk dopantdepthprofilemodificationduringmassspectrometricanalysisofmultilayernanostructures
AT osoberemok dopantdepthprofilemodificationduringmassspectrometricanalysisofmultilayernanostructures
AT vhpopov dopantdepthprofilemodificationduringmassspectrometricanalysisofmultilayernanostructures
AT bmromaniuk dopantdepthprofilemodificationduringmassspectrometricanalysisofmultilayernanostructures