Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry

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Datum:2021
Hauptverfasser: K. M. Al-Adamat, H. M. El-Nasser
Format: Artikel
Sprache:English
Veröffentlicht: 2021
Schriftenreihe:Ukrainian journal of physics
Online Zugang:http://jnas.nbuv.gov.ua/article/UJRN-0001276409
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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spelling open-sciencenbuvgovua-68402024-02-25T16:07:07Z Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry K. M. Al-Adamat H. M. El-Nasser 2071-0186 2021 en Ukrainian journal of physics http://jnas.nbuv.gov.ua/article/UJRN-0001276409 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Ukrainian journal of physics
spellingShingle Ukrainian journal of physics
K. M. Al-Adamat
H. M. El-Nasser
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
format Article
author K. M. Al-Adamat
H. M. El-Nasser
author_facet K. M. Al-Adamat
H. M. El-Nasser
author_sort K. M. Al-Adamat
title Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
title_short Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
title_full Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
title_fullStr Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
title_full_unstemmed Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
title_sort characterization of cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
publishDate 2021
url http://jnas.nbuv.gov.ua/article/UJRN-0001276409
work_keys_str_mv AT kmaladamat characterizationofcobaltphthalocyaninethinfilmonsiliconsubstrateusingspectroscopicellipsometry
AT hmelnasser characterizationofcobaltphthalocyaninethinfilmonsiliconsubstrateusingspectroscopicellipsometry
first_indexed 2025-07-17T11:26:54Z
last_indexed 2025-07-17T11:26:54Z
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