Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry

Збережено в:
Бібліографічні деталі
Дата:2021
Автори: K. M. Al-Adamat, H. M. El-Nasser
Формат: Стаття
Мова:Англійська
Опубліковано: 2021
Назва видання:Ukrainian journal of physics
Онлайн доступ:http://jnas.nbuv.gov.ua/article/UJRN-0001276409
Теги: Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

Репозитарії

Library portal of National Academy of Sciences of Ukraine | LibNAS
_version_ 1859488054867132416
author K. M. Al-Adamat
H. M. El-Nasser
author_facet K. M. Al-Adamat
H. M. El-Nasser
author_sort K. M. Al-Adamat
collection Open-Science
first_indexed 2025-07-17T11:26:54Z
format Article
id open-sciencenbuvgovua-6840
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
language English
last_indexed 2025-07-17T11:26:54Z
publishDate 2021
record_format dspace
series Ukrainian journal of physics
spelling open-sciencenbuvgovua-68402024-02-25T16:07:07Z Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry K. M. Al-Adamat H. M. El-Nasser 2071-0186 2021 en Ukrainian journal of physics http://jnas.nbuv.gov.ua/article/UJRN-0001276409 Article
spellingShingle Ukrainian journal of physics
K. M. Al-Adamat
H. M. El-Nasser
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
title Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
title_full Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
title_fullStr Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
title_full_unstemmed Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
title_short Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
title_sort characterization of cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
url http://jnas.nbuv.gov.ua/article/UJRN-0001276409
work_keys_str_mv AT kmaladamat characterizationofcobaltphthalocyaninethinfilmonsiliconsubstrateusingspectroscopicellipsometry
AT hmelnasser characterizationofcobaltphthalocyaninethinfilmonsiliconsubstrateusingspectroscopicellipsometry