Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
Збережено в:
| Дата: | 2021 |
|---|---|
| Автори: | , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
2021
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| Назва видання: | Ukrainian journal of physics |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0001276409 |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Репозитарії
Library portal of National Academy of Sciences of Ukraine | LibNAS| id |
open-sciencenbuvgovua-6840 |
|---|---|
| record_format |
dspace |
| spelling |
open-sciencenbuvgovua-68402024-02-25T16:07:07Z Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry K. M. Al-Adamat H. M. El-Nasser 2071-0186 2021 en Ukrainian journal of physics http://jnas.nbuv.gov.ua/article/UJRN-0001276409 Article |
| institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
| collection |
Open-Science |
| language |
English |
| series |
Ukrainian journal of physics |
| spellingShingle |
Ukrainian journal of physics K. M. Al-Adamat H. M. El-Nasser Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| format |
Article |
| author |
K. M. Al-Adamat H. M. El-Nasser |
| author_facet |
K. M. Al-Adamat H. M. El-Nasser |
| author_sort |
K. M. Al-Adamat |
| title |
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_short |
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_full |
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_fullStr |
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_full_unstemmed |
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_sort |
characterization of cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| publishDate |
2021 |
| url |
http://jnas.nbuv.gov.ua/article/UJRN-0001276409 |
| work_keys_str_mv |
AT kmaladamat characterizationofcobaltphthalocyaninethinfilmonsiliconsubstrateusingspectroscopicellipsometry AT hmelnasser characterizationofcobaltphthalocyaninethinfilmonsiliconsubstrateusingspectroscopicellipsometry |
| first_indexed |
2025-07-17T11:26:54Z |
| last_indexed |
2025-07-17T11:26:54Z |
| _version_ |
1850411421160964096 |