Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
Gespeichert in:
| Datum: | 2021 |
|---|---|
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | Englisch |
| Veröffentlicht: |
2021
|
| Schriftenreihe: | Ukrainian journal of physics |
| Online Zugang: | http://jnas.nbuv.gov.ua/article/UJRN-0001276409 |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Institution
Library portal of National Academy of Sciences of Ukraine | LibNAS| _version_ | 1859488054867132416 |
|---|---|
| author | K. M. Al-Adamat H. M. El-Nasser |
| author_facet | K. M. Al-Adamat H. M. El-Nasser |
| author_sort | K. M. Al-Adamat |
| collection | Open-Science |
| first_indexed | 2025-07-17T11:26:54Z |
| format | Article |
| id | open-sciencenbuvgovua-6840 |
| institution | Library portal of National Academy of Sciences of Ukraine | LibNAS |
| language | English |
| last_indexed | 2025-07-17T11:26:54Z |
| publishDate | 2021 |
| record_format | dspace |
| series | Ukrainian journal of physics |
| spelling | open-sciencenbuvgovua-68402024-02-25T16:07:07Z Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry K. M. Al-Adamat H. M. El-Nasser 2071-0186 2021 en Ukrainian journal of physics http://jnas.nbuv.gov.ua/article/UJRN-0001276409 Article |
| spellingShingle | Ukrainian journal of physics K. M. Al-Adamat H. M. El-Nasser Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title | Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_full | Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_fullStr | Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_full_unstemmed | Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_short | Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| title_sort | characterization of cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry |
| url | http://jnas.nbuv.gov.ua/article/UJRN-0001276409 |
| work_keys_str_mv | AT kmaladamat characterizationofcobaltphthalocyaninethinfilmonsiliconsubstrateusingspectroscopicellipsometry AT hmelnasser characterizationofcobaltphthalocyaninethinfilmonsiliconsubstrateusingspectroscopicellipsometry |