Deformation state of short-period AlGaN/GaN superlattices at different well-barrier thickness ratios - V. P. Kladko; N. V. Safriuk; H. V. Stanchu; A. V. Kuchuk; V. P. Melnyk; A. S. Oberemok; S. B. Kriviy; Z. V. Maksymenko; A. E. Belyaev; B. S. Yavich (Semiconductor Physics, Quantum Electronics and Optoelectronics, 2014)