Rengevych, O. V., Beketov, G. V., & Ushenin, Y. V. (2014). Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy.
Chicago-Zitierstil (17. Ausg.)Rengevych, O. V., G. V. Beketov, und Yu. V. Ushenin. Visualization of Submicron Si-rods by SPR-enhanced Total Internal Reflection Microscopy. 2014.
MLA-Zitierstil (8. Ausg.)Rengevych, O. V., et al. Visualization of Submicron Si-rods by SPR-enhanced Total Internal Reflection Microscopy. 2014.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.