APA (7th ed.) Citation

Rengevych, O. V., Beketov, G. V., & Ushenin, Y. V. (2014). Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy.

Chicago Style (17th ed.) Citation

Rengevych, O. V., G. V. Beketov, and Yu. V. Ushenin. Visualization of Submicron Si-rods by SPR-enhanced Total Internal Reflection Microscopy. 2014.

MLA (8th ed.) Citation

Rengevych, O. V., et al. Visualization of Submicron Si-rods by SPR-enhanced Total Internal Reflection Microscopy. 2014.

Warning: These citations may not always be 100% accurate.