Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy
Saved in:
| Date: | 2014 |
|---|---|
| Main Authors: | , , |
| Format: | Article |
| Language: | English |
| Published: |
2014
|
| Series: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000353047 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Institution
Library portal of National Academy of Sciences of Ukraine | LibNAS| id |
open-sciencenbuvgovua-72736 |
|---|---|
| record_format |
dspace |
| spelling |
open-sciencenbuvgovua-727362024-04-16T17:09:04Z Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy O. V. Rengevych G. V. Beketov Yu. V. Ushenin 1560-8034 2014 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000353047 Article |
| institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
| collection |
Open-Science |
| language |
English |
| series |
Semiconductor Physics, Quantum Electronics and Optoelectronics |
| spellingShingle |
Semiconductor Physics, Quantum Electronics and Optoelectronics O. V. Rengevych G. V. Beketov Yu. V. Ushenin Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy |
| format |
Article |
| author |
O. V. Rengevych G. V. Beketov Yu. V. Ushenin |
| author_facet |
O. V. Rengevych G. V. Beketov Yu. V. Ushenin |
| author_sort |
O. V. Rengevych |
| title |
Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy |
| title_short |
Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy |
| title_full |
Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy |
| title_fullStr |
Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy |
| title_full_unstemmed |
Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy |
| title_sort |
visualization of submicron si-rods by spr-enhanced total internal reflection microscopy |
| publishDate |
2014 |
| url |
http://jnas.nbuv.gov.ua/article/UJRN-0000353047 |
| work_keys_str_mv |
AT ovrengevych visualizationofsubmicronsirodsbysprenhancedtotalinternalreflectionmicroscopy AT gvbeketov visualizationofsubmicronsirodsbysprenhancedtotalinternalreflectionmicroscopy AT yuvushenin visualizationofsubmicronsirodsbysprenhancedtotalinternalreflectionmicroscopy |
| first_indexed |
2025-07-22T07:03:47Z |
| last_indexed |
2025-07-22T07:03:47Z |
| _version_ |
1850418935897260033 |