Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy
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| Date: | 2014 |
|---|---|
| Main Authors: | O. V. Rengevych, G. V. Beketov, Yu. V. Ushenin |
| Format: | Article |
| Language: | English |
| Published: |
2014
|
| Series: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000353047 |
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| Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
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