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Visualization of submicron Si-rods by SPR-enhanced total internal reflection microscopy

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Bibliographic Details
Date:	2014
Main Authors:	O. V. Rengevych, G. V. Beketov, Yu. V. Ushenin
Format:	Article
Language:	English
Published:	2014
Series:	Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Access:	http://jnas.nbuv.gov.ua/article/UJRN-0000353047
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Journal Title:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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