Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method
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| Datum: | 2014 |
|---|---|
| 1. Verfasser: | |
| Format: | Artikel |
| Sprache: | Englisch |
| Veröffentlicht: |
2014
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| Schriftenreihe: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| Online Zugang: | http://jnas.nbuv.gov.ua/article/UJRN-0000353052 |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
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Library portal of National Academy of Sciences of Ukraine | LibNAS| _version_ | 1859529765968412672 |
|---|---|
| author | V. N. Sheremet |
| author_facet | V. N. Sheremet |
| author_sort | V. N. Sheremet |
| collection | Open-Science |
| first_indexed | 2025-07-22T07:03:48Z |
| format | Article |
| id | open-sciencenbuvgovua-72741 |
| institution | Library portal of National Academy of Sciences of Ukraine | LibNAS |
| language | English |
| last_indexed | 2025-07-22T07:03:48Z |
| publishDate | 2014 |
| record_format | dspace |
| series | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| spelling | open-sciencenbuvgovua-727412024-04-16T17:09:11Z Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method V. N. Sheremet 1560-8034 2014 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000353052 Article |
| spellingShingle | Semiconductor Physics, Quantum Electronics and Optoelectronics V. N. Sheremet Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method |
| title | Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method |
| title_full | Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method |
| title_fullStr | Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method |
| title_full_unstemmed | Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method |
| title_short | Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method |
| title_sort | metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method |
| url | http://jnas.nbuv.gov.ua/article/UJRN-0000353052 |
| work_keys_str_mv | AT vnsheremet metrologicalaspectsofstudyingthespecificcontactresistivityofohmiccontactsbyusingthefourcontactmethod |