Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method

Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method

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Бібліографічні деталі
Дата:2014
Автор: V. N. Sheremet
Формат: Стаття
Мова:English
Опубліковано: 2014
Назва видання:Semiconductor Physics, Quantum Electronics and Optoelectronics
Онлайн доступ:http://jnas.nbuv.gov.ua/article/UJRN-0000353052
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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spelling open-sciencenbuvgovua-727412024-04-16T17:09:11Z Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method V. N. Sheremet 1560-8034 2014 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000353052 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Semiconductor Physics, Quantum Electronics and Optoelectronics
spellingShingle Semiconductor Physics, Quantum Electronics and Optoelectronics
V. N. Sheremet
Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method
format Article
author V. N. Sheremet
author_facet V. N. Sheremet
author_sort V. N. Sheremet
title Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method
title_short Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method
title_full Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method
title_fullStr Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method
title_full_unstemmed Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method
title_sort metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method
publishDate 2014
url http://jnas.nbuv.gov.ua/article/UJRN-0000353052
work_keys_str_mv AT vnsheremet metrologicalaspectsofstudyingthespecificcontactresistivityofohmiccontactsbyusingthefourcontactmethod
first_indexed 2024-04-17T05:14:39Z
last_indexed 2024-04-17T05:14:39Z
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