Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method

Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method

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Bibliographische Detailangaben
Datum:	2014
1. Verfasser:	V. N. Sheremet
Format:	Artikel
Sprache:	English
Veröffentlicht:	2014
Schriftenreihe:	Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Zugang:	http://jnas.nbuv.gov.ua/article/UJRN-0000353052
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Назва журналу:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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