2025-02-23T15:39:53-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: Query fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-72741%22&qt=morelikethis&rows=5
2025-02-23T15:39:53-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-72741%22&qt=morelikethis&rows=5
2025-02-23T15:39:53-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-23T15:39:53-05:00 DEBUG: Deserialized SOLR response
Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method

Metrological aspects of studying the specific contact resistivity of ohmic contacts by using the four-contact method

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Bibliographic Details
Main Author: V. N. Sheremet
Format: Article
Language:English
Published: 2014
Series:Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0000353052
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2025-02-23T15:39:53-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: Query fl=%2A&rows=40&rows=5&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-72741%22&qt=morelikethis
2025-02-23T15:39:53-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&rows=40&rows=5&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-72741%22&qt=morelikethis
2025-02-23T15:39:53-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-23T15:39:53-05:00 DEBUG: Deserialized SOLR response

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