Classification of methods for measuring current-voltage characteristics of semiconductor devices
Збережено в:
| Дата: | 2014 |
|---|---|
| Автор: | |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
2014
|
| Назва видання: | Technology and design in electronic equipment |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0000405250 |
| Теги: |
Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
|
| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Репозитарії
Library portal of National Academy of Sciences of Ukraine | LibNAS| id |
open-sciencenbuvgovua-73818 |
|---|---|
| record_format |
dspace |
| spelling |
open-sciencenbuvgovua-738182024-04-16T17:15:37Z Classification of methods for measuring current-voltage characteristics of semiconductor devices E. A. Ermolenko 2225-5818 2014 en Technology and design in electronic equipment http://jnas.nbuv.gov.ua/article/UJRN-0000405250 Article |
| institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
| collection |
Open-Science |
| language |
English |
| series |
Technology and design in electronic equipment |
| spellingShingle |
Technology and design in electronic equipment E. A. Ermolenko Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| format |
Article |
| author |
E. A. Ermolenko |
| author_facet |
E. A. Ermolenko |
| author_sort |
E. A. Ermolenko |
| title |
Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| title_short |
Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| title_full |
Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| title_fullStr |
Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| title_full_unstemmed |
Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| title_sort |
classification of methods for measuring current-voltage characteristics of semiconductor devices |
| publishDate |
2014 |
| url |
http://jnas.nbuv.gov.ua/article/UJRN-0000405250 |
| work_keys_str_mv |
AT eaermolenko classificationofmethodsformeasuringcurrentvoltagecharacteristicsofsemiconductordevices |
| first_indexed |
2024-04-17T05:19:00Z |
| last_indexed |
2024-04-17T05:19:00Z |
| _version_ |
1796884979342376960 |