Classification of methods for measuring current-voltage characteristics of semiconductor devices
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| Date: | 2014 |
|---|---|
| Main Author: | |
| Format: | Article |
| Language: | English |
| Published: |
2014
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| Series: | Technology and design in electronic equipment |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000405250 |
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| Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
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Library portal of National Academy of Sciences of Ukraine | LibNAS| id |
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open-sciencenbuvgovua-738182024-04-16T17:15:37Z Classification of methods for measuring current-voltage characteristics of semiconductor devices E. A. Ermolenko 2225-5818 2014 en Technology and design in electronic equipment http://jnas.nbuv.gov.ua/article/UJRN-0000405250 Article |
| institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
| collection |
Open-Science |
| language |
English |
| series |
Technology and design in electronic equipment |
| spellingShingle |
Technology and design in electronic equipment E. A. Ermolenko Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| format |
Article |
| author |
E. A. Ermolenko |
| author_facet |
E. A. Ermolenko |
| author_sort |
E. A. Ermolenko |
| title |
Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| title_short |
Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| title_full |
Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| title_fullStr |
Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| title_full_unstemmed |
Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| title_sort |
classification of methods for measuring current-voltage characteristics of semiconductor devices |
| publishDate |
2014 |
| url |
http://jnas.nbuv.gov.ua/article/UJRN-0000405250 |
| work_keys_str_mv |
AT eaermolenko classificationofmethodsformeasuringcurrentvoltagecharacteristicsofsemiconductordevices |
| first_indexed |
2025-07-22T07:20:35Z |
| last_indexed |
2025-07-22T07:20:35Z |
| _version_ |
1850419057456578560 |