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Determination of adhesion strength of thin oxide coatings on dielectric materials by the method of atomic force microscopy

Determination of adhesion strength of thin oxide coatings on dielectric materials by the method of atomic force microscopy

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Bibliographic Details
Main Authors: S. A. Bilokon, M. A. Bondarenko, Ju. Ju. Bondarenko
Format: Article
Language:English
Published: 2014
Series:Nanosystems, nanomaterials, nanotechnologies
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0000476017
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