Freik, D. M., Dzundza, B. S., Chaviak, I. I., Makovyshyn, V. I., & Arseniuk, I. A. (2014). Influence of surface and intergrain boundaries scattering mechanisms of current carriers in thin films based on tin telluride.
Chicago-Zitierstil (17. Ausg.)Freik, D. M., B. S. Dzundza, I. I. Chaviak, V. I. Makovyshyn, und I. A. Arseniuk. Influence of Surface and Intergrain Boundaries Scattering Mechanisms of Current Carriers in Thin Films Based on Tin Telluride. 2014.
MLA-Zitierstil (8. Ausg.)Freik, D. M., et al. Influence of Surface and Intergrain Boundaries Scattering Mechanisms of Current Carriers in Thin Films Based on Tin Telluride. 2014.
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