APA (7th ed.) Citation

Freik, D. M., Dzundza, B. S., Chaviak, I. I., Makovyshyn, V. I., & Arseniuk, I. A. (2014). Influence of surface and intergrain boundaries scattering mechanisms of current carriers in thin films based on tin telluride.

Chicago Style (17th ed.) Citation

Freik, D. M., B. S. Dzundza, I. I. Chaviak, V. I. Makovyshyn, and I. A. Arseniuk. Influence of Surface and Intergrain Boundaries Scattering Mechanisms of Current Carriers in Thin Films Based on Tin Telluride. 2014.

MLA (8th ed.) Citation

Freik, D. M., et al. Influence of Surface and Intergrain Boundaries Scattering Mechanisms of Current Carriers in Thin Films Based on Tin Telluride. 2014.

Warning: These citations may not always be 100% accurate.