Safriuk, N. V., Stanchu, G. V., Kuchuk, A. V., Kladko, V. P., Belyaev, A. E., & Machulin, V. F. (2013). X-ray diffraction investigation of GaN layers on Si(111) and Al2O3(0001) substrates.
Chicago Style (17th ed.) CitationSafriuk, N. V., G. V. Stanchu, A. V. Kuchuk, V. P. Kladko, A. E. Belyaev, and V. F. Machulin. X-ray Diffraction Investigation of GaN Layers on Si(111) and Al2O3(0001) Substrates. 2013.
MLA (8th ed.) CitationSafriuk, N. V., et al. X-ray Diffraction Investigation of GaN Layers on Si(111) and Al2O3(0001) Substrates. 2013.
Warning: These citations may not always be 100% accurate.