X-ray diffraction investigation of GaN layers on Si(111) and Al2O3(0001) substrates
Збережено в:
| Дата: | 2013 |
|---|---|
| Автори: | , , , , , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
2013
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| Назва видання: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0000352311 |
| Теги: |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Репозитарії
Library portal of National Academy of Sciences of Ukraine | LibNAS| _version_ | 1859538734344568832 |
|---|---|
| author | N. V. Safriuk G. V. Stanchu A. V. Kuchuk V. P. Kladko A. E. Belyaev V. F. Machulin |
| author_facet | N. V. Safriuk G. V. Stanchu A. V. Kuchuk V. P. Kladko A. E. Belyaev V. F. Machulin |
| author_sort | N. V. Safriuk |
| collection | Open-Science |
| first_indexed | 2025-07-22T10:06:05Z |
| format | Article |
| id | open-sciencenbuvgovua-83816 |
| institution | Library portal of National Academy of Sciences of Ukraine | LibNAS |
| language | English |
| last_indexed | 2025-07-22T10:06:05Z |
| publishDate | 2013 |
| record_format | dspace |
| series | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| spelling | open-sciencenbuvgovua-838162024-04-16T18:34:42Z X-ray diffraction investigation of GaN layers on Si(111) and Al2O3(0001) substrates N. V. Safriuk G. V. Stanchu A. V. Kuchuk V. P. Kladko A. E. Belyaev V. F. Machulin 1560-8034 2013 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000352311 Article |
| spellingShingle | Semiconductor Physics, Quantum Electronics and Optoelectronics N. V. Safriuk G. V. Stanchu A. V. Kuchuk V. P. Kladko A. E. Belyaev V. F. Machulin X-ray diffraction investigation of GaN layers on Si(111) and Al2O3(0001) substrates |
| title | X-ray diffraction investigation of GaN layers on Si(111) and Al2O3(0001) substrates |
| title_full | X-ray diffraction investigation of GaN layers on Si(111) and Al2O3(0001) substrates |
| title_fullStr | X-ray diffraction investigation of GaN layers on Si(111) and Al2O3(0001) substrates |
| title_full_unstemmed | X-ray diffraction investigation of GaN layers on Si(111) and Al2O3(0001) substrates |
| title_short | X-ray diffraction investigation of GaN layers on Si(111) and Al2O3(0001) substrates |
| title_sort | x-ray diffraction investigation of gan layers on si(111) and al2o3(0001) substrates |
| url | http://jnas.nbuv.gov.ua/article/UJRN-0000352311 |
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