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X-ray diffraction investigation of GaN layers on Si(111) and Al2O3(0001) substrates

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Bibliographic Details
Date:	2013
Main Authors:	N. V. Safriuk, G. V. Stanchu, A. V. Kuchuk, V. P. Kladko, A. E. Belyaev, V. F. Machulin
Format:	Article
Language:	English
Published:	2013
Series:	Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Access:	http://jnas.nbuv.gov.ua/article/UJRN-0000352311
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Journal Title:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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