The use of porous SiOx films in sensors based on surface plasmon resonance - Ye. Vakariuk; Yu. S. Hromovoi; V. A. Danko; H. V. Dorozhynskyi; S. A. Zyno; I. Z. Indutnyi; A. V. Samoilov; Yu. V. Ushenin; R. V. Khrystosenko; Ye. Shepeliavyi (Optoelectronics and Semiconductor Technique, 2013)