Thick layers liquid-phase epitaxy method
Saved in:
| Date: | 2013 |
|---|---|
| Main Authors: | S. N. Dranchuk, V. A. Zavadskij, V. A. Mokritskij |
| Format: | Article |
| Language: | English |
| Published: |
2013
|
| Series: | Technology and design in electronic equipment |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000405015 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Institution
Library portal of National Academy of Sciences of Ukraine | LibNASSimilar Items
Growing of heteroepitaxial layers on lattice mismatched substrates by the method of scanning liquid phase epitaxy
by: V. V. Tsybulenko, et al.
Published: (2020)
by: V. V. Tsybulenko, et al.
Published: (2020)
Obtaining heterostructures with quantium dots for sensors by using liquid phase epitaxy
by: Maronchuk, I.E., et al.
Published: (2004)
by: Maronchuk, I.E., et al.
Published: (2004)
Liquid phase epitaxy and properties of nanoheterostruc-tures based on the III–V compounds
by: I. E. Maronchuk, et al.
Published: (2012)
by: I. E. Maronchuk, et al.
Published: (2012)
Structural and composition irregularities in GaAs:Si/GaAs films grown by liquid-phase epitaxy
by: Kladko, V.P., et al.
Published: (2000)
by: Kladko, V.P., et al.
Published: (2000)
Phase method of ultrasonic thickness measurement
by: Yu. V. Kuts, et al.
Published: (2013)
by: Yu. V. Kuts, et al.
Published: (2013)
p-n junctions obtained in (Ge₂)x(GaAs)₁₋x varizone solid solutions by liquid phase epitaxy
by: Sapaev, B., et al.
Published: (2005)
by: Sapaev, B., et al.
Published: (2005)
Characterization of ZnSe nanocrystals grown by vapor phase epitaxy
by: Tishchenko, V.V., et al.
Published: (2006)
by: Tishchenko, V.V., et al.
Published: (2006)
Increasing the radiation resistance of single-crystal silicon epitaxial layers
by: Sh. D. Kurmashev, et al.
Published: (2014)
by: Sh. D. Kurmashev, et al.
Published: (2014)
Spectral photosensitivity of the m-n⁰-n structure on the basis of epitaxial layers
by: Yodgorova, D.M., et al.
Published: (2008)
by: Yodgorova, D.M., et al.
Published: (2008)
Electromigration effects at epitaxial growth of thin films: Phase-field modeling
by: A. V. Dvornychenko
Published: (2021)
by: A. V. Dvornychenko
Published: (2021)
Electromigration effects at epitaxial growth of thin films: Phase-field modeling
by: A. V. Dvornichenko
Published: (2021)
by: A. V. Dvornichenko
Published: (2021)
Measurement of thicknesses of optically transparent layered structures by the spectral interferometry method
by: K. A. Lukin, et al.
Published: (2017)
by: K. A. Lukin, et al.
Published: (2017)
Surface layers and thickness dependences of the thermoelectric properties of the steam-phase condensates of the last on the sieve
by: D. M. Freik, et al.
Published: (2015)
by: D. M. Freik, et al.
Published: (2015)
Features of growing epitaxial layers from solid solutions based on indium and aluminium arsenides
by: Yodgorova, D.M., et al.
Published: (2004)
by: Yodgorova, D.M., et al.
Published: (2004)
Crystal defects in epitaxial InP layers: electrical and scanning electron microscope study
by: Horvath, Zs.J., et al.
Published: (2004)
by: Horvath, Zs.J., et al.
Published: (2004)
On possibility of alpha-radioactive thick-layer waste analysis using high-vacuum technique methods
by: Dikiy, N.P., et al.
Published: (2002)
by: Dikiy, N.P., et al.
Published: (2002)
Allowable deviation of LC layer thickness in cholesteric LCDs
by: Rybalochka, A., et al.
Published: (2002)
by: Rybalochka, A., et al.
Published: (2002)
Adsorption of ions and thickness dependence of conductivity in liquid crystals
by: O. V. Kovalchuk
Published: (2011)
by: O. V. Kovalchuk
Published: (2011)
Adsorption of ions and thickness dependence of conductivity in liquid crystals
by: Kovalchuk, O.V.
Published: (2011)
by: Kovalchuk, O.V.
Published: (2011)
Magnetic method for determination of the thickness of protective concrete layer and diameter of rebars of building structures
by: A. P. Gusev, et al.
Published: (2017)
by: A. P. Gusev, et al.
Published: (2017)
Solid state doping of CdxHg₁₋xTe epitaxial layers with elements of V group
by: Vlasov, A.P., et al.
Published: (2006)
by: Vlasov, A.P., et al.
Published: (2006)
Modified backscattering method of the nanometer self-supporting films and surface layers thickness measurements
by: V. I. Soroka
Published: (2015)
by: V. I. Soroka
Published: (2015)
Comprehensive studies of defect production and strained states in silicon epitaxial layers and device structures based on them
by: Boltovets, N.S., et al.
Published: (2001)
by: Boltovets, N.S., et al.
Published: (2001)
The influence of the working layer thickness on the properties of hot-pressed powder layered composites
by: H. A. Bahliuk, et al.
Published: (2011)
by: H. A. Bahliuk, et al.
Published: (2011)
Simulation of growth of graded bandgap GaAsP layers at liquid phase electroepitaxy
by: Tsybulenko, V., et al.
Published: (2008)
by: Tsybulenko, V., et al.
Published: (2008)
On integral model of transverse dynamic displacements of thick elastic layer
by: V. A. Stojan, et al.
Published: (2013)
by: V. A. Stojan, et al.
Published: (2013)
Growing the epitaxial undoped and N-doped ZnO films by radical beam gettering epitaxy
by: Rogozin, I.V.
Published: (2006)
by: Rogozin, I.V.
Published: (2006)
Thickness dependence of refractivity in wall-adjacent epitropic liquid crystal
by: Yu. Popovskii, et al.
Published: (2014)
by: Yu. Popovskii, et al.
Published: (2014)
Thickness dependence of refractivity in wall-adjacent epitropic liquid crystal
by: Yu. Popovskii, et al.
Published: (2014)
by: Yu. Popovskii, et al.
Published: (2014)
Influence of a near-electrode layer thickness on the diffusion impedance
by: V. V. Pototska, et al.
Published: (2018)
by: V. V. Pototska, et al.
Published: (2018)
AFM study of micromorphology and microscopic growth mechanisms of Hg₁₋x CdxTe LPE epitaxial layers
by: Beketov, G.V., et al.
Published: (2000)
by: Beketov, G.V., et al.
Published: (2000)
Thermoelectric effect in single layer epitaxial graphene formed on semiconductor substrate. Simple analytical model
by: Z. Z. Alisultanov
Published: (2013)
by: Z. Z. Alisultanov
Published: (2013)
Thermoelectric effect in single layer epitaxial graphene formed on semiconductor substrate. Simple analytical model
by: Alisultanov, Z.Z.
Published: (2013)
by: Alisultanov, Z.Z.
Published: (2013)
Interdiffusion in EuS -based epitaxial superlattice nanostructures
by: Fedorov, A.G., et al.
Published: (2013)
by: Fedorov, A.G., et al.
Published: (2013)
Ionization annealing of semiconductor crystals. Part one: theoretical background
by: A. S. Garkavenko, et al.
Published: (2014)
by: A. S. Garkavenko, et al.
Published: (2014)
Ionization annealing of semiconductor crystals. Part two: the experiment
by: A. S. Garkavenko, et al.
Published: (2014)
by: A. S. Garkavenko, et al.
Published: (2014)
Quantum electrical capacitance of epitaxial graphene
by: Z. Z. Alisultanov, et al.
Published: (2015)
by: Z. Z. Alisultanov, et al.
Published: (2015)
Aging of ZnS:Mn thin - film electroluminescent devices grown by two different atomic-layer epitaxial processes
by: Vlasenko, N.A., et al.
Published: (2001)
by: Vlasenko, N.A., et al.
Published: (2001)
Determination of the distorted surface layer thickness in machined optically transparent polymer articles
by: Khlapova, N.P., et al.
Published: (2004)
by: Khlapova, N.P., et al.
Published: (2004)
Electroslag surfacing of layers of different thicknesses in stationary current-supplying mould
by: Ju. M. Kuskov, et al.
Published: (2018)
by: Ju. M. Kuskov, et al.
Published: (2018)
Similar Items
-
Growing of heteroepitaxial layers on lattice mismatched substrates by the method of scanning liquid phase epitaxy
by: V. V. Tsybulenko, et al.
Published: (2020) -
Obtaining heterostructures with quantium dots for sensors by using liquid phase epitaxy
by: Maronchuk, I.E., et al.
Published: (2004) -
Liquid phase epitaxy and properties of nanoheterostruc-tures based on the III–V compounds
by: I. E. Maronchuk, et al.
Published: (2012) -
Structural and composition irregularities in GaAs:Si/GaAs films grown by liquid-phase epitaxy
by: Kladko, V.P., et al.
Published: (2000) -
Phase method of ultrasonic thickness measurement
by: Yu. V. Kuts, et al.
Published: (2013)