Application of Rutherford backscattering method for diffusion and phase formation studies in thin films of Sn – Cu system

Application of Rutherford backscattering method for diffusion and phase formation studies in thin films of Sn – Cu system

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Бібліографічні деталі
Дата:2013
Автори: S. M. Voloshko, Ye. Kotenko, A. I. Oleshkevych
Формат: Стаття
Мова:English
Опубліковано: 2013
Назва видання:Metal Science and Treatment of Metals
Онлайн доступ:http://jnas.nbuv.gov.ua/article/UJRN-0000412231
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Назва журналу:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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spelling open-sciencenbuvgovua-845552024-04-16T18:39:34Z Application of Rutherford backscattering method for diffusion and phase formation studies in thin films of Sn – Cu system S. M. Voloshko Ye. Kotenko A. I. Oleshkevych 2073-9583 2013 en Metal Science and Treatment of Metals http://jnas.nbuv.gov.ua/article/UJRN-0000412231 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Metal Science and Treatment of Metals
spellingShingle Metal Science and Treatment of Metals
S. M. Voloshko
Ye. Kotenko
A. I. Oleshkevych
Application of Rutherford backscattering method for diffusion and phase formation studies in thin films of Sn – Cu system
format Article
author S. M. Voloshko
Ye. Kotenko
A. I. Oleshkevych
author_facet S. M. Voloshko
Ye. Kotenko
A. I. Oleshkevych
author_sort S. M. Voloshko
title Application of Rutherford backscattering method for diffusion and phase formation studies in thin films of Sn – Cu system
title_short Application of Rutherford backscattering method for diffusion and phase formation studies in thin films of Sn – Cu system
title_full Application of Rutherford backscattering method for diffusion and phase formation studies in thin films of Sn – Cu system
title_fullStr Application of Rutherford backscattering method for diffusion and phase formation studies in thin films of Sn – Cu system
title_full_unstemmed Application of Rutherford backscattering method for diffusion and phase formation studies in thin films of Sn – Cu system
title_sort application of rutherford backscattering method for diffusion and phase formation studies in thin films of sn – cu system
publishDate 2013
url http://jnas.nbuv.gov.ua/article/UJRN-0000412231
work_keys_str_mv AT smvoloshko applicationofrutherfordbackscatteringmethodfordiffusionandphaseformationstudiesinthinfilmsofsncusystem
AT yekotenko applicationofrutherfordbackscatteringmethodfordiffusionandphaseformationstudiesinthinfilmsofsncusystem
AT aioleshkevych applicationofrutherfordbackscatteringmethodfordiffusionandphaseformationstudiesinthinfilmsofsncusystem
first_indexed 2024-04-17T06:02:38Z
last_indexed 2024-04-17T06:02:38Z
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