APA (7th ed.) Citation

Bihun, R. I., Buchkovska, M. D., Stasiuk, Z. V., & Leonov, D. S. (2013). Formation of metallic character of electrical conduction in the vacuum condensates of copper deposited on a surface of a sublayer of silicon of subatomic thickness.

Chicago Style (17th ed.) Citation

Bihun, R. I., M. D. Buchkovska, Z. V. Stasiuk, and D. S. Leonov. Formation of Metallic Character of Electrical Conduction in the Vacuum Condensates of Copper Deposited on a Surface of a Sublayer of Silicon of Subatomic Thickness. 2013.

MLA (8th ed.) Citation

Bihun, R. I., et al. Formation of Metallic Character of Electrical Conduction in the Vacuum Condensates of Copper Deposited on a Surface of a Sublayer of Silicon of Subatomic Thickness. 2013.

Warning: These citations may not always be 100% accurate.