Formation of metallic character of electrical conduction in the vacuum condensates of copper deposited on a surface of a sublayer of silicon of subatomic thickness
Збережено в:
| Дата: | 2013 |
|---|---|
| Автори: | , , , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
2013
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| Назва видання: | Nanosystems, nanomaterials, nanotechnologies |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0000475583 |
| Теги: |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Репозитарії
Library portal of National Academy of Sciences of Ukraine | LibNAS| _version_ | 1859539817363144704 |
|---|---|
| author | R. I. Bihun M. D. Buchkovska Z. V. Stasiuk D. S. Leonov |
| author_facet | R. I. Bihun M. D. Buchkovska Z. V. Stasiuk D. S. Leonov |
| author_sort | R. I. Bihun |
| collection | Open-Science |
| first_indexed | 2025-07-22T10:36:11Z |
| format | Article |
| id | open-sciencenbuvgovua-85264 |
| institution | Library portal of National Academy of Sciences of Ukraine | LibNAS |
| language | English |
| last_indexed | 2025-07-22T10:36:11Z |
| publishDate | 2013 |
| record_format | dspace |
| series | Nanosystems, nanomaterials, nanotechnologies |
| spelling | open-sciencenbuvgovua-852642024-04-16T18:44:05Z Formation of metallic character of electrical conduction in the vacuum condensates of copper deposited on a surface of a sublayer of silicon of subatomic thickness R. I. Bihun M. D. Buchkovska Z. V. Stasiuk D. S. Leonov 1816-5230 2013 en Nanosystems, nanomaterials, nanotechnologies http://jnas.nbuv.gov.ua/article/UJRN-0000475583 Article |
| spellingShingle | Nanosystems, nanomaterials, nanotechnologies R. I. Bihun M. D. Buchkovska Z. V. Stasiuk D. S. Leonov Formation of metallic character of electrical conduction in the vacuum condensates of copper deposited on a surface of a sublayer of silicon of subatomic thickness |
| title | Formation of metallic character of electrical conduction in the vacuum condensates of copper deposited on a surface of a sublayer of silicon of subatomic thickness |
| title_full | Formation of metallic character of electrical conduction in the vacuum condensates of copper deposited on a surface of a sublayer of silicon of subatomic thickness |
| title_fullStr | Formation of metallic character of electrical conduction in the vacuum condensates of copper deposited on a surface of a sublayer of silicon of subatomic thickness |
| title_full_unstemmed | Formation of metallic character of electrical conduction in the vacuum condensates of copper deposited on a surface of a sublayer of silicon of subatomic thickness |
| title_short | Formation of metallic character of electrical conduction in the vacuum condensates of copper deposited on a surface of a sublayer of silicon of subatomic thickness |
| title_sort | formation of metallic character of electrical conduction in the vacuum condensates of copper deposited on a surface of a sublayer of silicon of subatomic thickness |
| url | http://jnas.nbuv.gov.ua/article/UJRN-0000475583 |
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