Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin - R. M. Rudenko; V. V. Voitovych; M. M. Krasko; A. H. Kolosiuk; A. M. Kraichynskyi; V. O. Yukhymchuk; V. A. Makara (Ukrainian Journal of Physics, 2013)