Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements
Збережено в:
| Дата: | 2012 |
|---|---|
| Автор: | |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
2012
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| Назва видання: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0000350277 |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Репозитарії
Library portal of National Academy of Sciences of Ukraine | LibNAS| id |
open-sciencenbuvgovua-90738 |
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dspace |
| spelling |
open-sciencenbuvgovua-907382024-04-17T16:37:31Z Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements Yu. V. Gomeniuk 1560-8034 2012 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000350277 Article |
| institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
| collection |
Open-Science |
| language |
English |
| series |
Semiconductor Physics, Quantum Electronics and Optoelectronics |
| spellingShingle |
Semiconductor Physics, Quantum Electronics and Optoelectronics Yu. V. Gomeniuk Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| format |
Article |
| author |
Yu. V. Gomeniuk |
| author_facet |
Yu. V. Gomeniuk |
| author_sort |
Yu. V. Gomeniuk |
| title |
Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| title_short |
Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| title_full |
Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| title_fullStr |
Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| title_full_unstemmed |
Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| title_sort |
determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| publishDate |
2012 |
| url |
http://jnas.nbuv.gov.ua/article/UJRN-0000350277 |
| work_keys_str_mv |
AT yuvgomeniuk determinationofinterfacestatedensityinhighkdielectricsiliconsystemfromconductancefrequencymeasurements |
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2024-04-18T05:02:32Z |
| last_indexed |
2024-04-18T05:02:32Z |
| _version_ |
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