Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements
Збережено в:
| Дата: | 2012 |
|---|---|
| Автор: | |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
2012
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| Назва видання: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0000350277 |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Репозитарії
Library portal of National Academy of Sciences of Ukraine | LibNAS| _version_ | 1859543630950170624 |
|---|---|
| author | Yu. V. Gomeniuk |
| author_facet | Yu. V. Gomeniuk |
| author_sort | Yu. V. Gomeniuk |
| collection | Open-Science |
| first_indexed | 2025-07-22T12:19:47Z |
| format | Article |
| id | open-sciencenbuvgovua-90738 |
| institution | Library portal of National Academy of Sciences of Ukraine | LibNAS |
| language | English |
| last_indexed | 2025-07-22T12:19:47Z |
| publishDate | 2012 |
| record_format | dspace |
| series | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| spelling | open-sciencenbuvgovua-907382024-04-17T16:37:31Z Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements Yu. V. Gomeniuk 1560-8034 2012 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000350277 Article |
| spellingShingle | Semiconductor Physics, Quantum Electronics and Optoelectronics Yu. V. Gomeniuk Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| title | Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| title_full | Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| title_fullStr | Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| title_full_unstemmed | Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| title_short | Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| title_sort | determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| url | http://jnas.nbuv.gov.ua/article/UJRN-0000350277 |
| work_keys_str_mv | AT yuvgomeniuk determinationofinterfacestatedensityinhighkdielectricsiliconsystemfromconductancefrequencymeasurements |