Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements
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| Datum: | 2012 |
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| Format: | Artikel |
| Sprache: | English |
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2012
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| Schriftenreihe: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| Online Zugang: | http://jnas.nbuv.gov.ua/article/UJRN-0000350277 |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
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open-sciencenbuvgovua-907382024-04-17T16:37:31Z Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements Yu. V. Gomeniuk 1560-8034 2012 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000350277 Article |
| institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
| collection |
Open-Science |
| language |
English |
| series |
Semiconductor Physics, Quantum Electronics and Optoelectronics |
| spellingShingle |
Semiconductor Physics, Quantum Electronics and Optoelectronics Yu. V. Gomeniuk Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| format |
Article |
| author |
Yu. V. Gomeniuk |
| author_facet |
Yu. V. Gomeniuk |
| author_sort |
Yu. V. Gomeniuk |
| title |
Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| title_short |
Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| title_full |
Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| title_fullStr |
Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| title_full_unstemmed |
Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| title_sort |
determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements |
| publishDate |
2012 |
| url |
http://jnas.nbuv.gov.ua/article/UJRN-0000350277 |
| work_keys_str_mv |
AT yuvgomeniuk determinationofinterfacestatedensityinhighkdielectricsiliconsystemfromconductancefrequencymeasurements |
| first_indexed |
2025-07-22T12:19:47Z |
| last_indexed |
2025-07-22T12:19:47Z |
| _version_ |
1850420922811416577 |