2025-02-23T14:16:05-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: Query fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-90738%22&qt=morelikethis&rows=5
2025-02-23T14:16:05-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-90738%22&qt=morelikethis&rows=5
2025-02-23T14:16:05-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-23T14:16:05-05:00 DEBUG: Deserialized SOLR response
Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements
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| Main Author: | |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
2012
|
| Series: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000350277 |
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2025-02-23T14:16:05-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: Query fl=%2A&rows=40&rows=5&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-90738%22&qt=morelikethis
2025-02-23T14:16:05-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&rows=40&rows=5&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-90738%22&qt=morelikethis
2025-02-23T14:16:05-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-23T14:16:05-05:00 DEBUG: Deserialized SOLR response