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Radiation/annealing-induced structural changes in GexAs40 xS60 glasses as revealed from high-energy synchrotron X-ray diffraction measurements

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Bibliographic Details
Date:	2012
Main Authors:	T. S. Kavetskyy, V. M. Tsmots, A. L. Stepanov
Format:	Article
Language:	English
Published:	2012
Series:	Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Access:	http://jnas.nbuv.gov.ua/article/UJRN-0000350383
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Journal Title:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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