2025-02-23T14:50:38-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: Query fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-94914%22&qt=morelikethis&rows=5
2025-02-23T14:50:38-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-94914%22&qt=morelikethis&rows=5
2025-02-23T14:50:38-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-23T14:50:38-05:00 DEBUG: Deserialized SOLR response
Schottky contact degradation at thermal annealing

Schottky contact degradation at thermal annealing

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Bibliographic Details
Main Authors: E. F. Venger, I. Gotovy, L. V. Shekhovtsov
Format: Article
Language:English
Published: 2012
Series:Optoelectronics and Semiconductor Technique
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0001287281
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2025-02-23T14:50:38-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: Query fl=%2A&rows=40&rows=5&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-94914%22&qt=morelikethis
2025-02-23T14:50:38-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: => GET http://localhost:8983/solr/biblio/select?fl=%2A&rows=40&rows=5&wt=json&json.nl=arrarr&q=id%3A%22open-sciencenbuvgovua-94914%22&qt=morelikethis
2025-02-23T14:50:38-05:00 DEBUG: VuFindSearch\Backend\Solr\Connector: <= 200 OK
2025-02-23T14:50:38-05:00 DEBUG: Deserialized SOLR response

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