Enhanced 2D plotting method for scanning probe microscopy imaging

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Bibliographic Details
Date:2011
Main Author: G. V. Beketov
Format: Article
Language:English
Published: 2011
Series:Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0000349434
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Journal Title:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
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author G. V. Beketov
author_facet G. V. Beketov
author_sort G. V. Beketov
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spelling open-sciencenbuvgovua-961172024-04-17T17:24:52Z Enhanced 2D plotting method for scanning probe microscopy imaging G. V. Beketov 1560-8034 2011 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000349434 Article
spellingShingle Semiconductor Physics, Quantum Electronics and Optoelectronics
G. V. Beketov
Enhanced 2D plotting method for scanning probe microscopy imaging
title Enhanced 2D plotting method for scanning probe microscopy imaging
title_full Enhanced 2D plotting method for scanning probe microscopy imaging
title_fullStr Enhanced 2D plotting method for scanning probe microscopy imaging
title_full_unstemmed Enhanced 2D plotting method for scanning probe microscopy imaging
title_short Enhanced 2D plotting method for scanning probe microscopy imaging
title_sort enhanced 2d plotting method for scanning probe microscopy imaging
url http://jnas.nbuv.gov.ua/article/UJRN-0000349434
work_keys_str_mv AT gvbeketov enhanced2dplottingmethodforscanningprobemicroscopyimaging