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Determination of Multilayer Structure Parameters by Means of Reconstruction of Scattering Matrix from Known Reflection Coefficients

Подається метод визначення діелектричної проникності та товщини шарів плоскої шаруватої структури за результатами вимірювання коефіцієнта відбиття плоскої електромагнітної хвилі. В цьому методі використовується підхід до реконструкції частотної залежності всіх елементів матриці розсіювання в обмежен...

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Bibliographic Details
Date:	2012
Main Authors:	Nazarchuk, Z. T., Synyavskyy, A. T.
Format:	Article
Language:	Russian
Published:	Видавничий дім «Академперіодика» 2012
Online Access:	http://rpra-journal.org.ua/index.php/ra/article/view/473
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Journal Title:	Radio physics and radio astronomy

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Radio physics and radio astronomy

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