Структурні властивості InGaPN на GaAs (001), узгоджені за параметром ґратки

Structural properties of lattice-matched InGaPN on GaAs (001) have comprehensively investigated by high resolution X-ray diffraction (HRXRD), Raman spectroscopy, and atomic force microscopy (AFM). The InGaPN layers were grown by metal organics vapor phase epitaxy (MOVPE). To obtain the lattice-match...

Full description

Saved in:
Bibliographic Details
Date:2018
Main Authors: Sritonwong, P., Sanorpim, S., Onabe, K.
Format: Article
Language:English
Published: Publishing house "Academperiodika" 2018
Online Access:https://ujp.bitp.kiev.ua/index.php/ujp/article/view/110
Tags: Add Tag
No Tags, Be the first to tag this record!
Journal Title:Ukrainian Journal of Physics

Institution

Ukrainian Journal of Physics