Екситоннi характеристики InxGa1-xAs-GaAs гетероструктур з квантовими ямами при низьких температурах

Characteristics of GaAs/InxGa1 xAs/GaAs heterostructures with a single quantum well, which were obtained at various growth parameters, are evaluated according to the results of measurements of low-temperature photoluminescence (PL) spectra and their corresponding theoretical analysis. The experiment...

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Bibliographic Details
Date:2018
Main Authors: Litovchenko, N. M., Korbutyak, D. V., Strilchuk, O. M.
Format: Article
Language:English
Ukrainian
Published: Publishing house "Academperiodika" 2018
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Online Access:https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2018291
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Journal Title:Ukrainian Journal of Physics

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Ukrainian Journal of Physics
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Summary:Characteristics of GaAs/InxGa1 xAs/GaAs heterostructures with a single quantum well, which were obtained at various growth parameters, are evaluated according to the results of measurements of low-temperature photoluminescence (PL) spectra and their corresponding theoretical analysis. The experimentally obtained temperature dependences of the energy position of the PL band maximum, hmax, band half-width, W0, and intensity, I, are examined. The values of energy of local phonons, Eph, exciton binding energy, Eex, and the Huang–Rhys factor, N, are determined. A comparison between the values obtained for those quantities and the growth parameters of considered specimens allowed us to assert that the highest-quality specimens are those that are characterized by low N values and one-mode phonon spectra.