Мiкроструктура тонких композитних плiвок Si–Sn

• Дата: 2018
• Автори: Neimash, V. B., Poroshin, V. M., Kabaldin, A. M., Yukhymchuk, V. O., Shepelyavyi, P. E., Makara, V. A., Larkin, S. Yu.
• Формат: Стаття
• Мова: English; Ukrainian
• Опубліковано: Publishing house "Academperiodika" 2018
• Теми: мiкроструктура тонких композитних плiвок; метод Оже; метод раманiвської спектроскопiї; Microstructure of thin composite films; Auger method; Raman spectroscopy
• Онлайн доступ: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2018363
• Назва журналу: Ukrainian Journal of Physics

Microstructure investigations of thin Si-Sn alloy films were carried out, by using Auger and Raman spectroscopies, X-ray fluorescence analysis, and electron microscopy. The films were produced by the thermal-vacuum coevaporation of Si and Sn. The properties of films with the Sn content ranging from...