Залежнiсть вiд товщини структурних, електричних i оптичних властивостей ZnS тонких плiвок, осаджених термiчним випаровуванням
Zinc sulfide (ZnS) thin films are deposited onto an ultrasonically clean glass substrate, by using the thermal evaporation technique at room temperature. The film thickness was varied in the range from 400 nm to 1300 nm. The X-ray diffraction (XRD), scanning electron microscopy (SEM), and energy dis...
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| Date: | 2018 |
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| Main Author: | |
| Format: | Article |
| Language: | English |
| Published: |
Publishing house "Academperiodika"
2018
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| Online Access: | https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2018682 |
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| Journal Title: | Ukrainian Journal of Physics |
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