Комбiнацiйне розсiювання свiтла в процесi iндукованої оловом кристалiзацiї аморфного кремнiю

Metal-induced crystallization in Si–Sn–Si thin film structures has been studied, by using the Raman scattering at various light powers. The Raman spectra are used to monitor the temperature, size, and concentration of Si crystals formed in the amorphous Si matrix. A significant acceleration of the m...

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Bibliographic Details
Date:2019
Main Authors: Neimash, V., Dovbeshko, G., Shepelyavyi, P., Danko, V., Melnyk, V., Isaiev, M., Kuzmich, A.
Format: Article
Language:English
Ukrainian
Published: Publishing house "Academperiodika" 2019
Subjects:
Online Access:https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019115
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Journal Title:Ukrainian Journal of Physics

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Ukrainian Journal of Physics