Дослiдження наноструктурованої поверхнi Si(001)-c(8 × 8) методом скануючої тунельної мiкроскопiї
The rarely observed Si(001)-c(8 × 8) reconstruction is a unique nanostructured state of the Si(001) surface. It was obtained through the sample contamination with trace amounts of Cu below the electron spectroscopy detection limit. As our detailed STM investigation shows, the surface is not atomical...
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| Datum: | 2019 |
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| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Publishing house "Academperiodika"
2019
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| Online Zugang: | https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019274 |
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| Назва журналу: | Ukrainian Journal of Physics |