Еліпсометричні та спектрометричні дослідження тонкої плівки (Ga0,2In0,8)2Se3
Thermal evaporation technique is used to deposite (Ga0,2In0,8)2Se3 thin films. The refractive index and extinction coefficient dispersions are obtained from the spectral ellipsometry measurements. The dispersion of the refractive index is described in the framework of the Wemple–Di Domenico model. T...
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| Date: | 2020 |
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| Main Authors: | , , , , , |
| Format: | Article |
| Language: | English |
| Published: |
Publishing house "Academperiodika"
2020
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| Online Access: | https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019510 |
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| Journal Title: | Ukrainian Journal of Physics |