Електричні властивості і енергетичні параметри фото-чутливих гетероструктур n-Mn2O3/n-CdZnTe

Conditions for the fabrication of isotype photodiode n-Mn2O3n-CdZnTe heterostructures by the spray pyrolysis of thin a-Mn2O3 bixbite films on n-CdZnTe crystalline substrates have been studied. The temperature dependences of the current-voltage (I-V) characteristics were used to analyze the mechanism...

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Збережено в:
Бібліографічні деталі
Дата:2021
Автори: Orlets’kyi, I.G., Ilashchuk, M.I., Maistruk, E.V., Parkhomenko, H.P., Maryanchuk, P.D.
Формат: Стаття
Мова:English
Ukrainian
Опубліковано: Publishing house "Academperiodika" 2021
Теми:
Онлайн доступ:https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2020288
Теги: Додати тег
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Назва журналу:Ukrainian Journal of Physics

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Ukrainian Journal of Physics
Опис
Резюме:Conditions for the fabrication of isotype photodiode n-Mn2O3n-CdZnTe heterostructures by the spray pyrolysis of thin a-Mn2O3 bixbite films on n-CdZnTe crystalline substrates have been studied. The temperature dependences of the current-voltage (I-V) characteristics were used to analyze the mechanisms of electron tunneling through the energy barrier of the heterojunction in the forward and reverse current regimes. The role of energy states at the n-Mn2O3/n-CdZnTe interface in the formation of the barrier parameters was clarified. Based on the capacitance-voltage (C-V) characteristics, the dynamics of changes in the capacitive parameters of the Mn2O3 thin film and the n-CdZnTe inversion layer and the relation between them were established. A model for the energy diagram of the n-Mn2O3/n-CdZnTe heterojunction was presented. The photoelectric properties of the examined heterostructure were analyzed.