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Характеристика наноструктурованих включень In6Se7 у шаруватих кристалах α-In2Se3 аналітичними методами рентгенівської дифрактометрії

As follows from the X-ray structural analysis, In2Se3 crystals grown from the stoichiometric melt using the Bridgman method turned out inhomogeneous: some of the samples obtained from the same ingot contained only the hexagonal α-In2Se3 phase, whereas inclusions of the In6Se7 crystalline phase were...

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Bibliographic Details
Main Authors:	Drapak, S.I., Gavrylyuk, S.V., Khalavka, Y.B., Fotiy, V.D., Fochuk, P.M., Fediv, O.I.
Format:	Article
Language:	English Ukrainian
Published:	Publishing house "Academperiodika" 2022
Subjects:	шаруватi кристали In2Se3 мiкроструктура включення нанокристалiтiв композити аналiтичнi методи рентгенiвської дифрактометрiї layered In2Se3 crystals microstructure nanocrystallite inclusions composites analytical X-ray diffractometry methods
Online Access:	https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2021393
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Характеристика наноструктурованих включень In6Se7 у шаруватих кристалах α-In2Se3 аналітичними методами рентгенівської дифрактометрії

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