Розвиток нейтронної рефлектометрії поверхневих шарів рідинних систем

• Дата: 2023
• Автори: Kosiachkin, Y., Bulavin, L.A., Kopcansky, P.
• Формат: Стаття
• Мова: English; Ukrainian
• Опубліковано: Publishing house "Academperiodika" 2023
• Теми: тонкi плiвки; багатошаровi структури; нейтронна рефлектометрiя; рентґенiвська рефлектометрiя; електрохiмiчнi iнтерфейси; оптимiзацiя сигналу; thin films; multilayered structures; neutron reflectometry; X-ray reflectometry; electrochemical interfaces; signal optimization
• Онлайн доступ: https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2023082
• Назва журналу: Ukrainian Journal of Physics

In order to develop the methods of neutron and X-ray reflectometries for the study of surface layers of liquid systems, a method of increasing the sensitivity of the reflectometric experiment to the appearance and evolution of near-surface layers is proposed. Therefore, Ni/Ti multilayered heterostructures are tested regarding for the practical applicability of the quasi-homogeneous approach with varying effective scattering length density of thin (thickness <100 nm) metal films in X-ray reflectometry experiments on the example of electrochemical interfaces. The structures with extremely low thickness of the Ni/Ti bilayer with different thickness ratios of Ni- and Ti-sublayers are synthesized by magnetron sputtering. Specular reflectivities of X-rays from the heterostructures are analyzed to conclude about the limits of the quasi-homogeneous approximation.