Розвиток нейтронної рефлектометрії поверхневих шарів рідинних систем
In order to develop the methods of neutron and X-ray reflectometries for the study of surface layers of liquid systems, a method of increasing the sensitivity of the reflectometric experiment to the appearance and evolution of near-surface layers is proposed. Therefore, Ni/Ti multilayered heterostru...
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| Datum: | 2023 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | English Ukrainian |
| Veröffentlicht: |
Publishing house "Academperiodika"
2023
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| Schlagworte: | |
| Online Zugang: | https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2023082 |
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| Назва журналу: | Ukrainian Journal of Physics |
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Ukrainian Journal of Physics| Zusammenfassung: | In order to develop the methods of neutron and X-ray reflectometries for the study of surface layers of liquid systems, a method of increasing the sensitivity of the reflectometric experiment to the appearance and evolution of near-surface layers is proposed. Therefore, Ni/Ti multilayered heterostructures are tested regarding for the practical applicability of the quasi-homogeneous approach with varying effective scattering length density of thin (thickness <100 nm) metal films in X-ray reflectometry experiments on the example of electrochemical interfaces. The structures with extremely low thickness of the Ni/Ti bilayer with different thickness ratios of Ni- and Ti-sublayers are synthesized by magnetron sputtering. Specular reflectivities of X-rays from the heterostructures are analyzed to conclude about the limits of the quasi-homogeneous approximation. |
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