Морфологія поверхні плівок суміші фулеренів C60/С70. Ідентифікація C60 та С70 у плівках C60/С70 за їх спектрами поглинання
Films of the C60/C70 mixture are deposited onto various substrates in a vacuum of 6.5 mPa using the thermal sublimation method. The surface morphology of 195-nm C60/C70 films is studied. It is found that polycrystalline and quasi-amorphous C60/C70 films are formed on silica and copper substrates, re...
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| Datum: | 2023 |
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| 1. Verfasser: | |
| Format: | Artikel |
| Sprache: | English Ukrainian |
| Veröffentlicht: |
Publishing house "Academperiodika"
2023
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| Online Zugang: | https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2023087 |
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| Назва журналу: | Ukrainian Journal of Physics |
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Ukrainian Journal of Physics| Zusammenfassung: | Films of the C60/C70 mixture are deposited onto various substrates in a vacuum of 6.5 mPa using the thermal sublimation method. The surface morphology of 195-nm C60/C70 films is studied. It is found that polycrystalline and quasi-amorphous C60/C70 films are formed on silica and copper substrates, respectively. The nature of the C60 and C70 absorption bands has been discussed in detail by analyzing the literature and our data. The absorption spectra of the C60 and C70 films and the C60/C70 mixture films are described as the sum of Gaussian functions. The absorption bands of C60 (at 2.474, 3.440, and 3.640 eV) and C70 (at 2.594, 2.804, 3.018, and 3.252 eV) can be used to identify those substances in fullerene mixtures. C60 is found to be the dominant component in the C60/C70 films. |
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