Some aspects of practical applications of speckles (Review) von Shylo, S. A.

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A device for calibrating and metrological verification of digital seismic recorders von Shcherbina, S. V.

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X-RAY SPECTRAL MICROANALYSIS OF ROCK-FORMING MINERALS AND IMPURITIES ON AN INCA ENERGY+ SYSTEM INTEGRATED WITH A JSM-6490LV SCANNING ELECTRON MICROSCOPE von Permiakov, V.V.

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MULTIFREQUENCY ALGORITHMS FOR DETERMINING THE MOISTURE CONTENT OF LIQUID EMULSIONS BY THE METHOD OF RESONANCE DIELCOMETRY von Korobko, A. A.

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Determination of engineering geophysical parameters of grounds on building sites and for seismic microzonation (methodical and metrological components of technology) von Bondarenko, M.S., Kulyk, V.V.

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