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      <title>Measuring an unknown voltage by using a single-electron transistor-based voltmeter</title>
      <pubDate>Fri, 17 Apr 2026 19:37:23 +0000</pubDate>
      <link>https://harvester.nas.gov.ua/Record/nasplib_isofts_kiev_ua-123456789-216228</link>
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      <author>Biswas, A.K.</author>
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      <dc:date>2021</dc:date>
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      <title>The advancement of silicon-on-insulator (SOI) devices and their basic properties</title>
      <pubDate>Fri, 17 Apr 2026 15:29:50 +0000</pubDate>
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      <author>Rudenko, T.E.</author>
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      <dc:date>2020</dc:date>
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      <title>Manifestation of the channeling effect when manufacturing JFET transistors</title>
      <pubDate>Thu, 16 Apr 2026 22:22:51 +0000</pubDate>
      <link>https://harvester.nas.gov.ua/Record/nasplib_isofts_kiev_ua-123456789-215913</link>
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      <author>Verbitskiy, V.G.</author>
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      <dc:date>2020</dc:date>
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      <title>Fidelity of noisy multiple-control reversible gates</title>
      <pubDate>Wed, 15 Apr 2026 10:30:30 +0000</pubDate>
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      <author>Deibuk, V.G.</author>
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      <dc:date>2020</dc:date>
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      <title>Energy processes in combined power supplies with linear capacitors and supercapacitors</title>
      <pubDate>Mon, 23 Mar 2026 18:53:44 +0000</pubDate>
      <link>https://harvester.nas.gov.ua/Record/nasplib_isofts_kiev_ua-123456789-215493</link>
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      <author>Biletskyi, O.O.</author>
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      <dc:date>2019</dc:date>
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